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This technical report investigates the transition from 2D to 3D growth of germanium (Ge) on silicon (Si) substrates through scanning tunneling microscopy, detailing the structural characteristics
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How to fill out Kinetic Pathway in Stranski-Krastanov Growth of Ge on Si(001)

01
Begin by preparing the silicon substrate by cleaning it thoroughly to remove any contaminants.
02
Place the silicon substrate in a molecular beam epitaxy (MBE) or chemical vapor deposition (CVD) chamber.
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Establish the desired growth temperature for the Ge layer, typically between 300-600°C, depending on the method used.
04
Initiate the growth process by starting the Ge source while monitoring the growth rate.
05
Use reflection high-energy electron diffraction (RHEED) to monitor the surface structure during the growth.
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Control the growth conditions such as temperature, pressure, and flux to achieve the desired Stranski-Krastanov growth mode.
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Once the initial Ge layer is deposited, allow for the formation of wetting layers before switching to the growth of quantum dots.
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Continue the growth process, allowing the formation of islands as the Ge layer thickens, which characterizes the Stranski-Krastanov growth mode.
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Finally, cool down the substrate gradually and perform post-growth annealing if necessary to enhance the quality of the Ge layer.

Who needs Kinetic Pathway in Stranski-Krastanov Growth of Ge on Si(001)?

01
Researchers in material science focusing on semiconductor growth.
02
Engineers working in the field of nanotechnology and quantum dot fabrication.
03
Academics conducting studies on epitaxial growth techniques.
04
Businesses involved in producing electronic devices that utilize Ge on Si substrates.
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Stranski–Krastanov growth consists of consecutive layer-by-layer (Frank – van der Merwe) growth and 3D islanding (Volmer – Weber) growth. The incomplete wetting which is required for formation of 3D islands arises from the relaxation of misfit strain at the island edges.
There are three major thin film growth modes: (1) Volmer–Weber or island growth, (2) Frank–Van der Merwe or layer-by-layer growth, and (3) Stranski–Krastanov growth. These growth mechanisms are illustrated in Fig. 3. Volmer–Weber of island growth (Fig.
Also known as 'layer-plus-island growth', the SK mode follows a two step process: initially, complete films of adsorbates, up to several monolayers thick, grow in a layer-by-layer fashion on a crystal substrate.
Stranski–Krastanov growth consists of consecutive layer-by-layer (Frank – van der Merwe) growth and 3D islanding (Volmer – Weber) growth. The incomplete wetting which is required for formation of 3D islands arises from the relaxation of misfit strain at the island edges.
A common technique used in compound semiconductor growth is molecular beam epitaxy (MBE). In this method, a source material is heated to produce an evaporated beam of particles, which travel through a very high vacuum (10−8 Pa; practically free space) to the substrate and start epitaxial growth.

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The Kinetic Pathway in Stranski-Krastanov Growth of Ge on Si(001) refers to the sequence of steps and mechanisms involved in the growth of germanium (Ge) islands on a silicon (Si) substrate. This process includes initial layer-by-layer growth followed by the formation of three-dimensional islands due to strain relaxation.
Researchers and scientists involved in material science and semiconductor fabrication, particularly those studying or applying Stranski-Krastanov growth processes, are required to file Kinetic Pathway reports.
To fill out the Kinetic Pathway, one must gather data on growth conditions, parameters like temperature and deposition rate, and details on the resulting nanostructures. This information should be organized into a structured format that outlines the growth phases and characteristics observed.
The purpose of documenting the Kinetic Pathway is to understand the growth dynamics, optimize conditions for better material quality, and predict the behavior of the deposited films in various applications.
Information that must be reported includes the growth temperature, deposition rate, time duration, surface morphology, strain relaxation mechanisms, and the final structural properties of the grown germanium islands.
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