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A thesis that explores a computer-aided design tool to predict metal migration failure in very large scale integration (VLSI) chips by calculating current density using a rectilinear region splitting
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How to fill out Current Density Calculation Using Rectilinear Region Splitting Algorithm for Very Large Scale Integration Metal Migration Analysis

01
Identify the dimensions and geometry of the metal interconnect region.
02
Divide the interconnect region into smaller rectilinear sub-regions using a grid or other partitioning method.
03
For each sub-region, calculate the current density using relevant equations and parameters such as voltage, resistivity, and geometry.
04
Aggregate the current densities from all sub-regions to determine the total current density across the entire interconnect region.
05
Analyze the results to identify regions of high current density that could contribute to metal migration issues.
06
Report the findings and suggest optimization strategies if necessary.

Who needs Current Density Calculation Using Rectilinear Region Splitting Algorithm for Very Large Scale Integration Metal Migration Analysis?

01
Electrical engineers involved in the design of Very Large Scale Integration (VLSI) circuits.
02
Researchers studying reliability and performance of semiconductor devices.
03
Manufacturers of integrated circuits needing to assess and mitigate metal migration risks.
04
Quality assurance teams evaluating the electrical performance of metal interconnects in chips.
05
Academics focusing on materials science and electrical engineering.
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Current Density Calculation Using Rectilinear Region Splitting Algorithm is a method used to analyze and assess the distribution of current density in metal layers of Very Large Scale Integration (VLSI) circuits, particularly to evaluate potential issues related to metal migration and ensure reliability in circuit performance.
Design engineers and semiconductor manufacturers are typically required to file Current Density Calculations using the Rectilinear Region Splitting Algorithm as part of the VLSI design verification process to ensure compliance with industry standards.
To fill out the Current Density Calculation form, one must input the geometry of the metal layers, their material properties, and the current flow parameters. The Rectilinear Region Splitting Algorithm is then applied to compute the current density across the specified regions based on these inputs.
The purpose of the Current Density Calculation is to predict and model the behavior of current flow in metal layers, which helps in identifying areas prone to metal migration that could lead to failure in VLSI circuits, thereby enhancing the design's reliability.
The report must include the geometry of the circuit, material properties, current distribution data, calculated current density values, and any potential risks or failure modes identified in the analysis.
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