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This document is a user's guide for the NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy, detailing system requirements, installation processes, operation of the database,
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How to fill out NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy
01
Access the NIST Backscattering-Correction-Factor Database online.
02
Select 'Auger Electron Spectroscopy' from the list of available databases.
03
Enter the relevant experimental parameters such as the incident electron energy and the material type.
04
Choose the appropriate correction factors related to the backscattering of Auger electrons for your specific conditions.
05
Submit the form to retrieve the backscattering correction factors.
06
Review the results and download or save the data if necessary.
Who needs NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy?
01
Researchers and scientists conducting Auger Electron Spectroscopy experiments.
02
Material scientists studying the properties of different materials at the microscopic level.
03
Quality control laboratories needing accurate measurements for surface analysis.
04
Academic institutions and industries involved in surface characterization.
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People Also Ask about
What is the difference between EDS and Auger electron spectroscopy?
While both EDS and Auger electron spectroscopy are techniques used for elemental analysis, EDS is not surface-sensitive and provides information about the bulk composition of a sample, whereas AES is surface-sensitive and provides detailed information about the surface composition.
What is the principle of XPS technique?
How XPS works. X-rays (photons) are shot onto a sample, and when electrons in the sample absorb enough energy, they are ejected from the sample with a certain kinetic energy.
What is the working principle of Auger?
Simply put, an auger is a spiral-shaped tool that is used to drill holes into the ground and other surfaces or materials. The spiraling metal shaft with a blade at the end of the device is known as a “flighting”. The flighting rotates to scrape, cut, or siphon out drilled materials.
What is the difference between XPS and Auger electron spectroscopy?
AES: Provides information about the elemental composition and chemical state of the surface. It is particularly sensitive to light elements. XPS: Provides information about the elemental composition, chemical state, and electronic state of the surface.
What are the applications of Auger electron spectroscopy?
Some of the main applications of Auger electron spectroscopy include elemental composition analysis, spatial and depth profiling of materials and characterization of nanostructures.
What is the principle of Auger electron spectroscopy?
The principle of Auger operates by allowing a high-energy electron from the beam to eject an electron from its orbit creating an empty hole in the orbit. As this occurs, another electron from a higher orbit moves to fill the empty space. As the electron changes from a higher to a lower orbit, it releases energy.
What is the principle of electron spectroscopy?
Basic theory In electron spectroscopy, depending on the technique, irradiating the sample with high-energy particles such as X-ray photons, electron beam electrons, or ultraviolet radiation photons, causes Auger electrons and photoelectrons to be emitted.
What are the applications of Auger spectroscopy?
Auger electrons are generated from all other elements; consequently, Auger Spectroscopy can be used to detect almost all elements in the near-surface region of solids. This is a major advantage of the technique. The incident electon may a few micro- meters into the solid and still dislodge core electrons.
What are Auger electrons used for?
Auger Electron Spectroscopy (AES) is a surface-sensitive analytical method the provides compositional information in the near-surface environment of materials (typically 1-5 atomic monolayers, 3-10 nm depth).
What is the principle of Auger effect?
The Auger effect refers to a process in which an atom is ionized in an inner shell, causing an electron to drop into the vacancy from a higher orbit.
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What is NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy?
The NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy provides correction factors to account for the effects of electron backscattering in Auger electron spectroscopy, allowing for more accurate quantification of elemental concentrations.
Who is required to file NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy?
Researchers and professionals using Auger electron spectroscopy who need to apply backscattering corrections to their data are required to reference and potentially file information pertaining to the NIST Backscattering-Correction-Factor Database.
How to fill out NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy?
To fill out the NIST Backscattering-Correction-Factor Database, users must input their experimental parameters such as the material being analyzed, electron beam energy, and the geometry of the measurement setup. Detailed instructions are typically available on the NIST website.
What is the purpose of NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy?
The purpose of the database is to provide users with standardized correction factors that improve the accuracy of Auger electron spectroscopy analyses, ensuring reliable quantitative results across different materials and experimental conditions.
What information must be reported on NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy?
The information that must be reported includes the material under investigation, the backscattering coefficients, the electron energy applied, as well as conditions of the Auger electron spectroscopy experiment such as incident angle and sample properties.
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