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Illegal Illlllll 11 Lille llllllllgl005506676Al l IL Lowell l Lille III! I111 Illll United States Patent 19 11 Handler et al. 45 Date of Patent: 54 5,506,676 Patent Number: Apr. 9, 1996 DEFECT DETECTION
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What is defect detection using fourier?
Defect detection using Fourier is a technique that uses Fourier analysis to identify defects or anomalies in signals or data by analyzing their frequency components.
Who is required to file defect detection using fourier?
There is no specific requirement for filing defect detection using Fourier. It is a technique used by researchers, engineers, or analysts to detect defects in signals or data.
How to fill out defect detection using fourier?
Defect detection using Fourier is a process that involves collecting the signal or data, performing Fourier analysis on it, and then identifying any abnormal frequency components or patterns that indicate defects. The specific method and tools used can vary depending on the application.
What is the purpose of defect detection using fourier?
The purpose of defect detection using Fourier is to identify and locate defects or anomalies in signals or data. It can be used in various fields such as manufacturing, quality control, signal processing, and data analysis.
What information must be reported on defect detection using fourier?
The information reported in defect detection using Fourier depends on the specific application and the type of defects being detected. It may include details about the signal or data being analyzed, the Fourier analysis method used, and any abnormalities or defects identified.
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