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IEC 63373 Edition 1.0 202202INTERNATIONAL STANDARD NORME INTERNATIONALEcolour insideiTeh STANDARD PREVIEW Lignes directrices pour(standards.iteh.ai) les mthodes dessai de rsistance dynamique ltat
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01
Set up the testing equipment in a controlled environment.
02
Connect the device under test (DUT) to the testing equipment.
03
Apply a known voltage to the DUT.
04
Measure the current flowing through the DUT at regular intervals.
05
Calculate the resistance of the DUT using Ohm's Law (Resistance = Voltage / Current).
06
Repeat the process multiple times to ensure accuracy and reliability.

Who needs dynamic on-resistance test method?

01
Engineers and technicians working in the semiconductor industry.
02
Companies designing and manufacturing electronic devices.
03
Quality control departments ensuring the functionality of electronic components.
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The dynamic on-resistance test method is a procedure used to measure the resistance of a semiconductor device during varying operational conditions, particularly under dynamic or changing input signals.
Manufacturers and suppliers of semiconductor devices are typically required to file the dynamic on-resistance test method to ensure compliance with industry standards and regulations.
To fill out the dynamic on-resistance test method, one must provide details such as device specifications, test conditions, measurement results, and any relevant comments or observations following the provided guidelines.
The purpose of the dynamic on-resistance test method is to evaluate the performance and reliability of semiconductor devices under operational conditions, ensuring they meet safety and functionality standards.
Information that must be reported includes device model number, test conditions (voltage, temperature), measurement data (resistance values), and any deviations or anomalies observed during testing.
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