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Application Note: Virtex-II, and Virtex-4 FPGA R Single-Event Upset Mitigation for Filing FPGA Block Memories Authors: Greg Miller, Carl Carmichael, and Gary Swift XAPP962 (v1.1) March 14, 2008, Summary

In previous research, a novel approach has been explored for mitigating these effects by simultaneously increasing the error correction factor of the system. This article presents a new design which combines the error correction and the memory switching capabilities into one integrated device, with much less complexity than would have normally been required by using separate components. The article describes the advantages and advantages of this design and the various requirements and applications that are being addressed by this new integrated system. Design Background: The idea behind the new system is a self-contained device that uses the memory switching capability within a single integrated system. The self-compiler is designed to be an exact replica of the system software and the memory switching and error correction are implemented using software. The system is specifically designed to allow the user to select which memory cells should be used within the self-compiler for single-event upsets and other types of memory errors. A second device is utilized in a manner similar to a data-only switching system such as the one described in [1]. This device allows users to specify which memory cells should be used via a switchable output logic cell configuration, which allows the self-compiler to select the correct data based on the logic error pattern of the cells. The self-compilation device may be implemented using an analog device or as a digital microcontroller. Figure 1 illustrates the general architecture for the new “Virtex-II” device and how it incorporates these elements. Figure 1. Virtex-II A Virtex-II consists of a single integrated chip (shown in blue in this drawing) which includes the self-compiler, the memory switching, and the error correcting and switching elements. This device has the capability to use either a digital memory switching device such as the one described in [1] (shown in red in this drawing) as a hardware switch or can be implemented as an analog device using a differential input/output device such as the one described in [2] (shown in green in this drawing). This new integrated device is specifically designed to allow users to select which memory cells should be used via a switchable output logic cell configuration, which allows the self-compiler to select the correct data based on the logic error pattern of the cells. A second device is utilized in a manner similar to a data-only switching system such as the one described in [1]. This device allows users. 1.

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Xilinx XAPP962 Single-Event Upset is a technical document that provides guidelines for designing and implementing mitigation techniques against single-event upsets (SEUs) in Xilinx FPGA devices.

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There is no specific requirement to file Xilinx XAPP962 Single-Event Upset. It is a technical document provided by Xilinx for designers and developers working with Xilinx FPGA devices.

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The purpose of Xilinx XAPP962 Single-Event Upset is to provide guidance and recommendations for designers and developers to mitigate the impact of single-event upsets in Xilinx FPGA devices.

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